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Resistance measurement probe - メーカー・企業と製品の一覧

Resistance measurement probeの製品一覧

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Comparison of contact resistance values of sensitive probes with other companies.

We are introducing a comparison of contact resistance values between our products and overseas products from other companies.

Introduction to the comparison test of contact resistance values between Inks' IP130B-2C probe and probes from other manufacturers. The test conditions used the JCM GP035-50R contact resistance measurement device for both the IP probe and the other (overseas) probes, with an applied current of 5A and an application time of 0.1 seconds. The insertion depth was 5.2mm for the IP probe and 4.3mm for the other (overseas) probes. As a result, the IP probe exhibited a more stable contact resistance value within a narrower range. The average value was also lower, indicating very good performance. [Test Results (Partial)] ■ Contact Resistance Values (mΩ) *Measured 3000 times  ・IP Probe (Sample 1)    Max: 11.6    Min: 8.6    Ave: 9.4  ・Other Manufacturer's Probe (Sample 1)    Max: 200.4    Min: 15.7    Ave: 92.7 *For more details, please refer to the external link page or feel free to contact us.

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Contact Probe for Resistance Measurement for Semiconductor Testing

Introduction of a wide lineup of 4-probe probes for achieving high resistivity measurements. Comprehensive product support available. *Materials provided.

Micro Point Pro's "4-Needle Probe (Contact Probe)" features high-quality high-speed steel, characterized by extremely low resistance values. The tip uses carbide and osmium alloys, allowing for choices in durability and electrical contact properties. The probe body offers a reliable solution for resistivity measurement with the "Fell Probe (Chrome-Plated Body)," as well as two other types: "Disposable Probe (Plastic Body)" and "Al Probe (Aluminum Body)." 【Features】 ■ Low-friction upper guide ■ Wide selection of probe tip radii ■ Individual needle pressure adjustment ■ High breakdown voltage and low leakage

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